X-RAY DETECTION PROPERTIES OF PURE AND DOPED MERCURIC IODIDE (HgI2) CRYSTALS GROWN USING SOLUTION-BASED METHODS

Abstract

This study investigates the X-ray detection properties of pure and doped mercuric iodide (HgI2) crystals grown using solution-based methods. HgI2 crystals synthesized using a controlled evaporation technique, with some samples doped with various concentrations of copper (Cu) and lead (Pb). The crystals were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDS). X-ray detection performance was evaluated through measurements of sensitivity, energy resolution, and temporal stability. Results indicate that low-level doping (0.1-0.5 mol%) with Cu or Pb can enhance detector performance compared to pure HgI2, with Cu-doped samples showing the most promising results. This study demonstrates the potential for solution-grown doped HgI2 crystals as cost-effective alternatives for room-temperature X-ray detection applications. Keywords: Mercuric iodide, X-ray detection, Solution growth, Doping, Copper, Lead.